Transferproject T8
Transferproject T8
Two-color thermography for increased process robustness
Within the transfer project T8 “Two-color thermography for increased process robustness” the Influence of beam shaping and nanoparticle additives on the formation of hot cracks in wrought aluminum alloys will be quantified by means of spatially and temporally resolved temperature measurement in PBF-LB/M based on two-color thermography. For this purpose, a temperature measurement system resulting from the preliminary work of Subproject A5 will be further developed and qualified. This measurement concept will be used for temperature measurement in the running PBF-LB/M process to quantify the hot cracking tendency as a function of beam shape and nanoparticle concentration throughout the process. The aim is to link the knowledge gained about the occurrence of hot cracks with the currently known hot crack theory by calculating the hot crack tendency. In the project, the Institute of Photonic Technologies (LPT) will further develop the two-color thermography system in cooperation with Sensortherm GmbH and successively calibrate and validate it within the PBF-LB/M environment. Once these steps are completed, the institute will reproduce the results generated in A5 using two-color thermography and use the additional temperature data generated to expand the process knowledge regarding beam shaping and nanoparticle additivation. Meanwhile, Sensortherm GmbH is developing an automated evaluation routine based on the experimentally generated data to reliably capture the temperature-based process characteristics and improve the efficiency of two-color thermography. This is the foundation for an in-process control, through which the generated findings can be experimentally confirmed, and the understanding on the effect of beam shaping and nanoparticle additivation on the hot cracking of AW-6082 will be extended.
Prof. Dr.-Ing. Michael Schmidt
Lehrstuhl für Photonische Technologien (LPT, Prof. Schmidt)
Institute of Photonic Technologies (LPT)
- Telefon: +49 9131 85-23234
- E-Mail: michael.schmidt@lpt.uni-erlangen.de
Richard Rothfelder, M.Sc.
Lehrstuhl für Photonische Technologien (LPT, Prof. Schmidt)
Institute of Photonic Technologies (LPT)
- Telefon: +49913185-6410264104
- E-Mail: richard.rothfelder@lpt.uni-erlangen.de